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Mountain系列

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Mountain系列
Mountain系列
Mountain系列主要应用于化合物半导体衬底外延的缺陷检测,集成多通道光学检测技术,覆盖Scratch/Stain/Particle/Micro Pit/Micropipe/Triangle/Downfall/SF/Carrot等缺陷类型。
基本参数
Water Size 4"/6"/8"
Multiple Detection Channels Phase detection channel, scattering light detection channel, phase detection channel, and photoluminescence signal.
Detection Applications In LED, optoelectronics, telecommunications, automotive-grade and other compound semiconductor wafer substrates and epitaxy.
Detection Items Surface and photoluminescence detection.
Stability The yield difference of the same material is less than 0.1%.
Main Defect Types Cracks, micropipe, pit, stain, step bunching, particle, slipline, scratch, etc.
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